The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Aug. 31, 2009
Hiroyasu Fujiwara, Hamamatsu, JP;
Tadashi Kawazoe, Tokyo, JP;
Motoichi Ohtsu, Tokyo, JP;
Hamamatsu Photonics K.K., Hamamatsu-shi, Shizuoka, JP;
The University of Tokyo, Tokyo, JP;
Abstract
A signal waveform measuring apparatusA is configured from: a signal optical system, a reference optical system, a time difference setting unitsetting a time difference between signal light Land reference light L, a wavelength conversion elementincluding an aggregate of crystals of a dye molecule and generating converted light L, which has been wavelength-converted to a shorter wavelength than incident light made incident on the crystal aggregate, at an intensity proportional to an r-th power (r>1) of the intensity of the incident light, a photodetectordetecting the converted light L, generated at the elementat the intensity that is in accordance with the intensity of the signal light L, the intensity of the reference light L, and the time difference between the two, and a signal waveform analyzerperforming analysis of the detection result of the converted light Land thereby acquiring a time waveform of the signal light L. A signal waveform measuring apparatus and a measuring method that enable a time waveform of signal light to be measured with good precision by a simple configuration are thereby realized.