The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 22, 2012
Filed:
Dec. 18, 2008
Thomas James Batzinger, Burnt Hills, NY (US);
Riccardo Barigazzi, Florence, IT;
Fabrizio Betti, Florence, IT;
Waseem Ibrahim Faidi, Schenectady, NY (US);
Eugenio Giorni, Florence, IT;
Dane E. Hackenberger, Mifflintown, PA (US);
Federico Iozzelli, Pistoia, IT;
Manoj Kumar Km, Bangalore, IN;
Zongqi Sun, Albany, NY (US);
Toby L. Sweigart, Burnham, PA (US);
Thomas James Batzinger, Burnt Hills, NY (US);
Riccardo Barigazzi, Florence, IT;
Fabrizio Betti, Florence, IT;
Waseem Ibrahim Faidi, Schenectady, NY (US);
Eugenio Giorni, Florence, IT;
Dane E. Hackenberger, Mifflintown, PA (US);
Federico Iozzelli, Pistoia, IT;
Manoj Kumar Km, Bangalore, IN;
Zongqi Sun, Albany, NY (US);
Toby L. Sweigart, Burnham, PA (US);
Nuovo Pignone S.p.A., Florence, IT;
Abstract
Ultrasound inspection methods for noisy materials and related probes are disclosed to inspect a defect in a cast material that use polycarbonate delay layers having a first surface configured to be disposed on a surface of the cast material; and an acoustic crystal element disposed on a second surface of the polycarbonate delay layer.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile