The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 22, 2012

Filed:

Feb. 06, 2009
Applicants:

Michael Mertler, Freinsheim, DE;

Bernd Sachweh, Meckenheim, DE;

Markus Linsenbühler, Ludwigshafen, DE;

Michael Schäfer, Altrip, DE;

David Y. H. Pui, Plymouth, MN (US);

Heinz Fissan, Kerken, DE;

Jing Wang, Minneapolis, MN (US);

Weon Gyu Shin, Falcon Heights, MN (US);

Inventors:

Michael Mertler, Freinsheim, DE;

Bernd Sachweh, Meckenheim, DE;

Markus Linsenbühler, Ludwigshafen, DE;

Michael Schäfer, Altrip, DE;

David Y. H. Pui, Plymouth, MN (US);

Heinz Fissan, Kerken, DE;

Jing Wang, Minneapolis, MN (US);

Weon Gyu Shin, Falcon Heights, MN (US);

Assignees:

BASF SE, Ludwigshafen, DE;

Regents of The University of Minnesota, South Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method is proposed for characterizing a totality of particles. The method can be used in particular for characterizing microparticular or nanoparticular aerosols. The method comprises the following steps:


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