The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Mar. 28, 2011
Kanji Kobayashi, Kyoto, JP;
Hideo Nakajima, Nagaokakyo, JP;
Kanji Kobayashi, Kyoto, JP;
Hideo Nakajima, Nagaokakyo, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
To provide a scanning probe microscope wherein the scanning means is not damaged by fluids, the scanning probe microscopecomprises a cantilever support partfor supporting a cantilever; displacement measurement partsandfor measuring the displacement of the cantilever; a specimen containercomprising sidewallsand bottom surfaceand containing a fluidand a specimen S; a carrying stageon which the specimen containeris placed; and a scanning meansfor moving and scanning the carrying stage. While the cantileveris immersed in the fluidthat is contained in the specimen container, the carrying stageis moved, and the displacement of the cantileveris measured. The scanning probe microscopefurther comprises a ring-shaped protective matthat is capable of absorbing the fluid. A mounting mechanismis formed on the outer peripheral surface of the carrying stagefor removably attaching the protective matby its inner peripheral area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile