The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Jan. 21, 2009
Hiroshi Dohji, Kanagawa-ken, JP;
Hironori Makimura, Kanagawa-ken, JP;
Minoru Kida, Kanagawa-ken, JP;
Nobuyoshi Tanaka, Tokyo, JP;
Hiroshi Dohji, Kanagawa-ken, JP;
Hironori Makimura, Kanagawa-ken, JP;
Minoru Kida, Kanagawa-ken, JP;
Nobuyoshi Tanaka, Tokyo, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
To provide a method and the like for testing a main memory in a multi processor system, which is capable of reducing a test execution time and accordingly a start-up time as compared with the case where a single processor is used for the test. The present invention provides a method for testing a main memory (MM) in a multi processor system (MPS) including a main processor (MP) and multiple sub processors (SP) each having a DMA transfer mechanism and a local store (LS). The method and the like including: MP allocating a partial memory region (PMA) in MM to each SP; MP requesting each SP to test the allocated PMA; each SP filling LS thereof with initial data in response to receiving the request; each SP transferring the data stored in LS thereof to PMA by using a DMA transfer; each SP transferring the data stored in PMA to LS thereof by a DMA transfer; and SP testing the data in LS; and MP judging a test result on MM by putting together the tests results in response to the completion of all the tests by respective SP.