The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Jan. 22, 2009
Applicant:

Shunsuke Ariyoshi, Kobe, JP;

Inventor:

Shunsuke Ariyoshi, Kobe, JP;

Assignee:

Sysmex Corporation, Kobe, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a sample processing apparatus, comprising: a sample processing unit for processing a sample with an auxiliary item used to process the sample; an output device for outputting a processing result by the sample processing unit; and a controller for determining whether or not the auxiliary item is appropriate for the sample processing by sample processing unit, and controlling, when determining that the auxiliary item is not appropriate for the sample processing by the sample processing unit, the output device so as to output the processing result and reliability information showing that the processing result has a low reliability. Also disclosed is a method for outputting the processing result by the sample processing apparatus and a computer program product.


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