The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Jun. 05, 2008
Makoto Hayasaki, Tokyo, JP;
Makoto Hayasaki, Tokyo, JP;
Sharp Kabushiki Kaisha, Osaka, JP;
Abstract
There are provided: a pattern detection process section for extracting a partial image made of pixels including a target pixel from input image data; a displaced image generation section for generating a self-displaced image by displacing at least a part of the partial image through a predetermined method; and a matching test determination section for determining whether an image pattern included in the partial image matches an image pattern included in the self-displaced image or not. When the matching test determination section determines that the matching exists, a target pixel in the partial image or a block made of pixels including the target pixel is regarded as a feature point. Consequently, even when image data is subjected to a process such as enlarging and reducing, it is possible to extract a feature point that properly specifies the image data regardless of the enlarging/reducing process.