The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Jun. 18, 2008
Applicants:

Matthias Fenchel, Erlangen, DE;

Andreas Schilling, Gomaringen, DE;

Stefan Thesen, Dormitz, DE;

Inventors:

Matthias Fenchel, Erlangen, DE;

Andreas Schilling, Gomaringen, DE;

Stefan Thesen, Dormitz, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

In the method according to at least one embodiment of the invention, a first segmentation of a structure in an image data record is firstly carried out, and a first final segmentation result is obtained therefrom. A region in the image data record is selected based on the first final segmentation result obtained. A first band is placed at a first, outwardly pointing distance from the selected region. This first band characterizes a background region. A second band is placed at a second, inwardly pointing distance from the projected first final segmentation result of the first segmentation. This second band characterizes a structure region. A further segmentation is carried out based on the characterized background region and the characterized structure region, and the final segmentation result of the further segmentation is saved and/or displayed. Furthermore, an image processing unit for carrying out the method is disclosed.


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