The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Dec. 02, 2008
Martin Eckert, Moetzingen, DE;
Georg Goecke, Steinenbronn, DE;
Marta Junginger, Altdorf, DE;
Klaus Kempter, Weil im Schoenbuch, DE;
Markus Ulbricht, Espenhain, DE;
Martin Eckert, Moetzingen, DE;
Georg Goecke, Steinenbronn, DE;
Marta Junginger, Altdorf, DE;
Klaus Kempter, Weil im Schoenbuch, DE;
Markus Ulbricht, Espenhain, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Compact graphical representations of common test fail signatures and process related test fails are provided through methods of selecting, calculating and/or presenting information. The input may be a list of failing tests on a sample of devices under test from chip and/or wafer process fails. The failing tests are identified and then other tests that fail at the same time may be identified. Several graphical outputs are provided, including all possible combinations between test fails and between test fails and process fails. The dependencies are printed as sorted two dimensional bitmaps that are compact representations of the results using color codes. Subtraction of two independent bitmaps is provided, which eliminates common properties and emphasizes differences between multiple bitmaps which allows for quick identification of differences of process fails potentially different between the two different bitmaps indicating potential root causes for the selected one of the test fails.