The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Feb. 29, 2008
Applicants:

Akira Oosawa, Minato-ku, JP;

Yoshiyuki Moriya, Minato-ku, JP;

Hiroshi Hiramatsu, Minato-ku, JP;

Inventors:

Akira Oosawa, Minato-ku, JP;

Yoshiyuki Moriya, Minato-ku, JP;

Hiroshi Hiramatsu, Minato-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

More accurate search for similar cases can be carried out in the case where images by different imaging methods exist. An imaging information analysis unit obtains imaging information of search target images obtained by different imaging methods in the same examination from accompanying information of the images, and a similar case database storing similar case information sets each including examination ID, imaging information, a characteristic quantity, and image interpretation/diagnosis support information is searched in processing by a first similar case information search unit, a second similar case information search unit, and a judgment unit. A corresponding portion of the similar case information sets satisfying three conditions comprising agreement of the imaging information with the search target images, agreement of examination between the portion of the similar case information sets, and similarity of a content-based characteristic to the search target images is obtained.


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