The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Oct. 06, 2009
Viet Linh DO, Carlsbad, CA (US);
Wei Fu, San Diego, CA (US);
Arash Farhoodfar, Kanata, CA;
Applied Micro Circuits Corporation, San Diego, CA (US);
Abstract
An inter-symbol interference (ISI) pattern-weighted early-late phase detector is provided. An I clock and a function-controlled oscillation cycle phase delay Q clock are generated. The I clock frequency is divided by n, creating a reference clock. A serial data stream is sequentially sampled with the I clock, and with the function-controlled varied phase delay Q clock, creating digital I-bit and varied phase delay Q-bit values, respectively. The values are segmented into n-bit digital words. I clock phase corrections are identified and a modulation factor is determined in response to comparing varied phase delay Q-bit values with I-bit values. Also identified are bit sequence patterns associated with each I-bit value. Each I-bit value is weighted in response to the identified bit sequence pattern and the identified I clock phase correction. The modulation factor is applied to the weighted average, and I and Q clock phase error signals are generated.