The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Oct. 05, 2009
Applicants:

Kiyotaka Ito, Hyogo, JP;

Yasumori Hino, Nara, JP;

Harumitsu Miyashita, Nara, JP;

Isao Kobayashi, Osaka, JP;

Inventors:

Kiyotaka Ito, Hyogo, JP;

Yasumori Hino, Nara, JP;

Harumitsu Miyashita, Nara, JP;

Isao Kobayashi, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 (2006.01); G11B 20/10 (2006.01); G11B 27/36 (2006.01); G11B 7/0045 (2006.01);
U.S. Cl.
CPC ...
Abstract

A reproduction signal evaluation method according to the present invention relates to adjustment of an edge portion between a shortest mark and a shortest space in a data sequence including marks and spaces in combination that is recordable on an information recording medium. In a pattern including a shortest mark and a shortest space adjacent before or after the shortest mark, a shift amount of an edge of the shortest mark is obtained from a differential metric calculated regarding one of a first pattern in which a space adjacent to the shortest mark and not adjacent to the shortest space is longer than the shortest space; and a second pattern in which a mark adjacent to the shortest space and not adjacent to the shortest mark is longer than the shortest mark.


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