The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Jun. 01, 2009
Applicant:
Masayoshi Karasawa, Tokyo, JP;
Inventor:
Masayoshi Karasawa, Tokyo, JP;
Assignee:
Olympus Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A microscope system comprises an objective, an image pickup device, a diameter-variable field stop disposed in a conjugate position with the focal plane of the objective, a magnification modifying device disposed in an optical path between the objective and the image pickup device, for modifying the magnification of the image pickup device and a control unit for controlling in such a way as to maintain a state where a field stop diameter is always larger than a field diameter.