The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8179433 B1

PDF
Full Text
Expired
Date of Patent:
May. 15, 2012

Filed:

Dec. 11, 2008
Applicant:

Hiroshi Fujiki, Tokyo, JP;

Inventor:

Hiroshi Fujiki, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/04 (2006.01); H04N 5/335 (2011.01);
U.S. Cl.
CPC ...
Abstract

The microscopic imaging apparatus includes a system controlling unit for obtaining a VD time setting value, and for obtaining the number of electric charge subtracting pulses, a synchronization signal generating unit for generating a vertical synchronization signal on the basis of the VD time setting value output from the system controlling unit and the horizontal synchronization signal, and a timing generating unit for extracting the electric charge of the imaging device by supplying the horizontal synchronization signal by the number of electric charge subtracting pulses to the imaging device as the electric charge subtracting pulses, and for generating a read pulse synchronous with the vertical synchronization signal in order to stop the accumulation of the electric charge of the imaging device after exposure is started.


Find Patent Forward Citations

Fujiki, Hiroshi. (2012). Microscopic imaging apparatus and microscopic imaging method (U.S. Patent No. 8179433). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8179433

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