The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Aug. 10, 2009
Julian Daubrawa, Munich, DE;
Jan M. W. Krueger, Munich, DE;
Julian Daubrawa, Munich, DE;
Jan M. W. Krueger, Munich, DE;
Astrium GmbH, Taufkirchen, DE;
Abstract
In a method for optimizing the accuracy of position determination, and/or for reducing the integrity risk, of a receiver in a global satellite navigation system having a plurality of satellites, for at least one satellite that is visible to the receiver (E), a deviation error (AF) is determined which is a function of the geometric orientation of the satellite relative to the receiver, and of at least one system parameter. The deviation error is determined based on an additional deviation error generated by an error projection into a coordinate system of the receiver. A first or a second value, whichever is smaller of the two, is used as the deviation error. The first value for the at least one system parameter is determined using a respective specified parameter value. The second value is determined for the at least one system parameter, using a modified parameter value which is modified with respect to the specified parameter value in such a way that a lower error in the modified parameter value of the at least one system parameter is accepted as true.