The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Dec. 01, 2010
Jeong-yeop Lee, Daegu, KR;
Hoon Choi, Incheon, KR;
Young Seok Choi, Gyeonggi-Do, KR;
Kwang-sik OH, Gyeongsangbuk-Do, KR;
Jeong-Yeop Lee, Daegu, KR;
Hoon Choi, Incheon, KR;
Young Seok Choi, Gyeonggi-Do, KR;
Kwang-Sik Oh, Gyeongsangbuk-Do, KR;
LG Display Co., Ltd., Seoul, KR;
Abstract
A process condition evaluation method for a liquid crystal display module (LCM) includes: a first step of obtaining a threshold power measuring pattern, an analysis sample for a cell bonding status in an LCD fabrication process, and obtaining a lower substrate sample by separating an upper substrate from the threshold power measuring pattern; a second step of supplying voltages on a gate pad on the lower substrate sample with sequentially increasing a voltage level by a predetermined unit by using an electrical device, and obtaining a threshold current and a threshold voltage by measuring currents at a drain pad whenever voltage increased by a predetermined unit is applied to the gate pad; and a third step of obtaining threshold power based on the threshold current and the threshold voltage, and thereby evaluating process conditions of the LCM.