The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 15, 2012

Filed:

Jun. 15, 2004
Applicant:

Dagmar Beyerlein, San Francisco, CA (US);

Inventor:

Dagmar Beyerlein, San Francisco, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61M 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for determining tissue contact and penetration depth are provided. In one aspect, the system includes a needle and a pressure measurement assembly. The needle, in one exemplary embodiment, includes a first end and a second end with at least one aperture located a predetermined distance from the first end. The pressure measurement assembly is connected with a portion of the needle to measure pressure of fluid flowing through the needle. The pressure measurement assembly measures a first pressure when the needle contacts tissue and a second difference in pressure when the needle penetrates the tissue and the aperture becomes occluded.


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