The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 15, 2012
Filed:
Oct. 30, 2007
Andreas Jakimov, Munich, DE;
Manuel Hertter, Munich, DE;
Stefan Schneiderbanger, Lauterbach, DE;
MTU Aero Engines GmbH, Munich, DE;
Abstract
The present invention concerns a device for measuring of layer thicknesses, especially for measuring of layer thicknesses of a structural part () during or after a coating process, with at least a first and a second path length measuring device (), wherein a first path length (a) to a surface () of a layer () being applied to the structural part () is measured by means of the first path length measuring device () and a second path length (b) to an uncoated surface () of the structural part () is measured by means of the second path length measuring device () continuously or at predetermined moments of time. According to the invention, the device () furthermore comprises at least a third path length measuring device () for measuring and monitoring the position of the first path length measuring device () relative to the structural part (), wherein a third path length (c) is measured by the third path length measuring device () to determine the position of the structural part () continuously or at predetermined moments of time. The invention furthermore involves a method for measuring of layer thicknesses, especially for measuring of layer thicknesses of a structural part () during or after a coating process.