The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Jun. 26, 2007
Applicants:

Rafael Castro, Round Rock, TX (US);

Brian Keith Odom, Georgetown, TX (US);

Inventors:

Rafael Castro, Round Rock, TX (US);

Brian Keith Odom, Georgetown, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

One or more counter units of a data acquisition device used to perform sampling operations. Each of the counter units is configurable to operate in a selected one of a plurality of modes. During operation, at least one of the counter units may receive a measurement signal (or input signal) acquired by the data acquisition device and also a sample clock signal. The counter unit may sample the measurement signal based on the selected operational mode and timing of the sample clock, and at a rate that is independent of the frequency of the measurement signal. Furthermore, the counter unit may sample the measurement signal based on a selected one of a plurality of timing modes associated with the sample clock signal. The counter units may take samples of the measurement signal to perform at least one of the following types of measurements: period, frequency, pulse-width, semi-period, time separation, or event counting.


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