The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Oct. 23, 2009
Applicants:

Divesh Srivastava, Summit, NJ (US);

Ioannis Kotidis, Lake Hiawatha, NJ (US);

Inventors:

Divesh Srivastava, Summit, NJ (US);

Ioannis Kotidis, Lake Hiawatha, NJ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/00 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods, systems and computer instructions on computer readable media are disclosed for optimizing a query, including a first join path, a second join path, and an optimizer, to efficiently provide high quality information from large, multiple databases. The methods and systems include evaluating a schema graph identifying the join paths between a field X and a field Y, and a value X=x, to identify the top-few values of Y=y that are reachable from a specified X=x value when using the join paths. Each data path that instantiates the schema join paths can be scored and evaluated as to the quality of the data with respect to specified integrity constraints to alleviate data quality problems. Agglomerative scoring methodologies can be implemented to compute high quality information in the form of a top-few answers to a specified problem as requested by the query.


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