The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Apr. 30, 2008
Applicants:

Timothy Bisson, Sunnyvale, CA (US);

Shankar Pasupathy, Sunnyvale, CA (US);

Inventors:

Timothy Bisson, Sunnyvale, CA (US);

Shankar Pasupathy, Sunnyvale, CA (US);

Assignee:

NetApp, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A facility for comparing two datasets and identifying metadata differences between the two datasets irrespective of the manner in which the data is stored. In some embodiments, the facility includes a comparison unit and a catalog unit. The comparison unit compares a hierarchical hash of a first dataset with a hierarchical hash of a second dataset, the hierarchical hashes each including a plurality of hierarchical hash values, to identify differences in metadata of the first and second datasets by progressively comparing the hierarchical hash values of the first and second hierarchical hashes without comparing the metadata of the first and second datasets. The catalog unit generates a catalog of differences between the first and second datasets, the catalog indicating differences in metadata of the first and second datasets.


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