The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Oct. 31, 2008
Jonathan R. Hosking, Scarsdale, NY (US);
Jonathan R. Hosking, Scarsdale, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system for estimating a magnitude of extremely rare events upon receiving a complete data sample and a specific exceedance probability are described. A distribution is chosen for a complete data sample. An optimal subsample fitted to the distribution is obtained. The optimal subsample is a largest acceptable subsample. A subsample is considered as an acceptable subsample when a goodness-of-fit test on the subsample is satisfactory (i.e., higher than a predetermined threshold). In addition, if a tail measure of an acceptable subsample lies outside a confidence interval of any smaller acceptable subsample, the acceptable subsample is considered as an unacceptable. Based on the optimal subsample and an inputted exceedance probability, a quantile estimate is computed, e.g., by executing an inverse of a cumulative distribution function of generalized Pareto distribution.