The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8175819 B1

PDF
Full Text
Expired
Date of Patent:
May. 08, 2012

Filed:

Jun. 13, 2007
Applicant:

Yoshitaka Fujisawa, Kodaira, JP;

Inventor:

Yoshitaka Fujisawa, Kodaira, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01B 5/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A tire inspection device generates an analyzing wavelet for wavelet transformation correlating time, corresponding to tire surface position, and frequency, based on a frequency representing a characteristic portion of a predetermined tire surface structure. After this, the tire inspection device generates and stores an integer numeric filter from the created analyzing wavelet, detects the tire surface structure, carries out wavelet transformation on a signal obtained by the detection by using the numeric filter as the analyzing wavelet, and outputs the transformation result as the characteristic information representing the characteristic portion.


Find Patent Forward Citations

Fujisawa, Yoshitaka. (2012). Tire inspection device (U.S. Patent No. 8175819). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8175819

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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