The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Feb. 16, 2007
Asit Dan, Pleasantville, NY (US);
Richard P. King, Scarsdale, NY (US);
Heiko Ludwig, New York, NY (US);
Andrea Schmidt, Boeblingen, DE;
Hendrik Wagner, Stuttgart, DE;
Asit Dan, Pleasantville, NY (US);
Richard P. King, Scarsdale, NY (US);
Heiko Ludwig, New York, NY (US);
Andrea Schmidt, Boeblingen, DE;
Hendrik Wagner, Stuttgart, DE;
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for measuring performance of system. The method includes the steps of retrieving a metric definition from a declarative metrics specification, obtaining a list of computing nodes from a database that are currently assigned to the metric definition, obtaining resource data provided by the computing nodes in the list of computing nodes and determining the metric of system performance based on the metric definition and the resource data. The computing nodes in the list of computing nodes are nodes of a cluster of nodes having a dynamically varying node count.