The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Dec. 27, 2007
Tae Geun Kim, Seoul, KR;
Tae Geun Kim, Seoul, KR;
Other;
Abstract
Provided is an optical imaging system based on a coherence frequency domain reflectometry, including: a light source generating an electromagnetic wave; a splitting unit splitting the electromagnetic wave into first and second beams; a reflecting unit reflecting the first beam and re-transmitting the reflected first beam to the splitter; an objective lens projecting the second beam onto an object to be recorded; a photodetector transforming an interference pattern into a current signal, wherein the first beam reflected from the reflector interferes with the second beam reflected from the object to generate the interference pattern; and an electronic processing unit processing the current signal to generate an image of the object from the interference pattern. Therefore, a lateral resolution can be improved, and Rayleigh limits can be overcome.