The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Aug. 18, 2009
Grant Matthews, Fort Wayne, IN (US);
Grant Matthews, Fort Wayne, IN (US);
Exelis, Inc., McLean, VA (US);
Abstract
A system for calibrating a spectrometer includes wide field-of-view (WFOV) optics providing a first light path to a WFOV spectrometer, and narrow field-of-view (NFOV) optics providing a second light path to a NFOV spectrometer. A de-focusing optic is selectively positioned in the first or second light paths. A scan controller selectively controls the WFOV or NFOV optics to scan a celestial body. A processor is configured to calibrate the de-focusing optic, while the WFOV optics scan the celestial body. First, the WFOV optics scan the celestial body without the de-focusing optic positioned in the first light path. Second, the WFOV optics scan the celestial body with the de-focusing optic positioned in the first light path. Next, the processor calibrates the NFOV spectrometer, while the NFOV optics and the de-focusing optic scan the celestial body. After the NFOV spectrometer is calibrated, the NFOV spectrometer may be used to measure the albedo of the earth.