The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Mar. 28, 2008
Applicants:
Akihiro Namba, Tokyo, JP;
Hirobumi Suzuki, Hino, JP;
Hiroshi Ishiwata, Hachioji, JP;
Inventors:
Assignee:
Olympus Corporation, Tokyo, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/00 (2006.01); G01B 9/00 (2006.01); G01B 11/14 (2006.01); G02B 7/04 (2006.01); G02B 27/40 (2006.01); G02B 27/64 (2006.01); G03B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A focal position determining method determines a focal position of an objective lens focused on an observed target region in a specimen. The focal position determining method includes measuring any one of the focal position of the objective lens at a near point and the focal position of the objective lens at a far point or both so as to determine the focal position of the objective lens focused on the observed target region based on the measured focal position.