The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Jul. 29, 2008
Satoshi Suzuki, Kita-ku, JP;
Katsuhiro Sato, Kita-ku, JP;
Yoichi Sano, Kita-ku, JP;
Leica Geosystems AG, Heerbrugg, CH;
Hexagon Metrology Kabushiki Kaisha, Sagamihara-Shi, JP;
Abstract
An optical system of a shape measuring instrument includes a laser diode, a first optical system irradiating an object to be measured with laser beam, a second optical system focusing reflected light from the object to be measured, and a CCD line sensor portion for detecting a laser beam from the second optical system, where the first optical system includes an optical path displacing unit for displacing an optical path for laser beam, the optical path displacing unit includes a glass plate rotating about a rotating axis extending in a direction perpendicular to a displacement plane of the optical path, a rotating unit for the glass plate, and a rotating unit controller, and the rotating unit controller causes a rotation angle of the rotating unit to coincide with a rotation angle of the rotating unit obtained when the maximum value of an amount of light received by the CCD line sensor according to rotation of the rotating unit is measured by the rotating unit controller.