The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Apr. 20, 2009
Alexander M. Raykhman, East Greenwich, RI (US);
Eugene Naidis, Ashkelon, IL (US);
Ellis S. Waldman, Providence, RI (US);
Alexander M. Raykhman, East Greenwich, RI (US);
Eugene Naidis, Ashkelon, IL (US);
Ellis S. Waldman, Providence, RI (US);
Dolphin Measurement Systems LLC, Providence, RI (US);
Abstract
A system and method for measurement of parameters of a conductive material, include generating an oscillating electromagnetic field (EMF) interacting with a sample portion from a remotely positioned source; measuring values of components of impedance of the electromagnetic; populating a system of equations including a theory of electromagnetism-based mathematical model of the electromagnetic system; solving the system of equations to calculate values of a distance between the sample portion and the source, thickness of the sample portion in proximity to a point of projection of the source onto the sample portion and electromagnetic properties of the sample portion; outputting the calculated values as the measured values; and repeating the steps of generating, populating, solving, outputting and repeating using the calculated values for the step of populating in place of the measured component values.