The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Oct. 06, 2005
Applicants:

Swee Chuan Tjin, Singapore, SG;

Lian Soon NG, Singapore, SG;

Cheong Boon Soh, Singapore, SG;

Rudi Irawan, Singapore, SG;

Xiaoqin Fang, Singapore, SG;

Inventors:

Swee Chuan Tjin, Singapore, SG;

Lian Soon Ng, Singapore, SG;

Cheong Boon Soh, Singapore, SG;

Rudi Irawan, Singapore, SG;

Xiaoqin Fang, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a fluorescent sample on a substrate. The method includes exciting the fluorescent sample with an exciting light source for the generation of a sample fluorescent optical signal and a substrate fluorescent optical signal substantially eliminated. The microfluidic substrate fluorescent optical signal is leaving the sample fluorescent optical signal. The sample fluorescence optical signal can then be processed.


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