The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Sep. 12, 2006
Hendrik F. Hamann, Yorktown Heights, NY (US);
Snorri Ingvarsson, Reykjavik IS, IS;
James A. Lacey, Mahopac, NY (US);
Hendrik F. Hamann, Yorktown Heights, NY (US);
Snorri Ingvarsson, Reykjavik IS, IS;
James A. Lacey, Mahopac, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A high resolution material observation system includes an object having at least one spatial dimension sufficient to support production of near-field infrared emissions, a holder adapted to receive a sample to be observed, the holder further adapted to position the sample in the near-field infrared emissions, and a thermal excitation unit, adapted to be thermally coupled to at least one of the object and the sample. The thermal excitation unit is further adapted to causing black body radiation in either the object or the sample within the infrared spectrum.