The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Nov. 17, 2007
Saïd Boumsellek, San Diego, CA (US);
Thomas J. Kuehn, Potomac Falls, VA (US);
Saïd Boumsellek, San Diego, CA (US);
Thomas J. Kuehn, Potomac Falls, VA (US);
Implant Sciences Corporation, Wilmington, MA (US);
Abstract
A trace detection system includes at least two stages coupled to operate in series. An ion mobility spectrometer (IMS) stage has a sampling inlet to receive a sample to be analyzed. An ion source ionizes the sample. The IMS applies an electrical field to the ionized sample to move the ionized sample toward an IMS outlet. A differential mobility spectrometer (DMS) stage coupled in series with the IMS stage receives the ionized sample from the IMS stage. Preferably, the system includes a mass spectrometer (MS) stage coupled in series with the DMS stage to receive the ionized sample from the DMS stage via a vacuum interface. A roughing vacuum pump evacuates a first stage of the MS stage to a first pressure below atmospheric pressure. A high vacuum pump evacuates a second stage of the MS stage to a second pressure below the first pressure.