The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Feb. 11, 2009
Applicants:
BO Yang, Kanagawa, JP;
Hiroyuki Chiku, Kanagawa, JP;
Inventors:
Bo Yang, Kanagawa, JP;
Hiroyuki Chiku, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/553 (2006.01);
U.S. Cl.
CPC ...
Abstract
An object of the present invention is to provide a metal particle with which a highly-sensitive testing method can be conducted, and a testing method using such metal particle. The present invention provides a metal particle, which is produced by coating a metal particle labeled with a molecule binding to an analyte with a mixture of two or more types of water-soluble polymer having a mercapto group, a dithiol group or a sulfide group and differing in molecular weight.