The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 08, 2012
Filed:
Nov. 30, 2004
Applicants:
Junko Takahashi, Tsukuba, JP;
Chiaki Kato, Tsukuba, JP;
Inventors:
Junko Takahashi, Tsukuba, JP;
Chiaki Kato, Tsukuba, JP;
Assignee:
Daikin Industires, Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/02 (2006.01); C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method having higher sensitivity in a bioassay method utilizing cell response of a microorganism, for detecting the presence of a chemical in a test specimen is provided. The method of the present invention is characterized in that it uses specified gene-disrupted strains.
Quick Actions:
Takahashi, Junko. (2012). Method of examining chemical using gene-disrupted strain (U.S. Patent No. 8173387). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8173387
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile