The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Sep. 01, 2003
Applicants:

Kunihiro Oda, Ibaraki, JP;

Ryo Suzuki, Ibaraki, JP;

Inventors:

Kunihiro Oda, Ibaraki, JP;

Ryo Suzuki, Ibaraki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B22F 1/00 (2006.01); B22F 1/02 (2006.01); C22C 1/04 (2006.01); C22C 29/12 (2006.01); H01F 1/00 (2006.01); C01B 21/068 (2006.01); C01B 33/06 (2006.01); H01L 21/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is an iron silicide sputtering target in which the oxygen as the gas component in the target is 1000 ppm or less, and a manufacturing method of such iron silicide sputtering target including the steps of melting/casting high purity iron and silicon under high vacuum to prepare an alloy ingot, subjecting the ingot to gas atomization with inert gas to prepare fine powder, and thereafter sintering the fine powder. With this iron silicide sputtering target, the amount of impurities will be reduced, the thickness of the βFeSifilm during deposition can be made thick, the generation of particles will be reduced, a uniform and homogenous film composition can be yielded, and the sputtering characteristics will be favorable. The foregoing manufacturing method is able to stably produce this target.


Find Patent Forward Citations

Loading…