The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 08, 2012

Filed:

Aug. 25, 2011
Applicant:

Alysia M. Sagi-dolev, Palo Alto, CA (US);

Inventor:

Alysia M. Sagi-Dolev, Palo Alto, CA (US);

Assignee:

Qylur Security Systems, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for efficiently screening for threatening items are presented. The system includes a test unit configured to subject the object to a combination of two or more different types of tests, sensors configured to receive test outcome from the object and generate corresponding output signals, and a computation unit receiving and processing the output signals to generate parameter values. The computation unit combines the parameter values from the different types of tests to determine a set of risk factors that indicate a likelihood that the threatening item is present in the object, wherein the parameter values include visualization data obtained from different measurement angles.


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