The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Oct. 10, 2008
Applicants:

Ping Cheng, Beijing, CN;

Ya Bin Dang, Beijing, CN;

Lin Luo, Beijing, CN;

Peter K. Malkin, Ardsley, NY (US);

Vadakkedathu T. Rajan, Briarcliff Manor, NY (US);

Yuan Yuan, Beijing, CN;

Inventors:

Ping Cheng, Beijing, CN;

Ya Bin Dang, Beijing, CN;

Lin Luo, Beijing, CN;

Peter K. Malkin, Ardsley, NY (US);

Vadakkedathu T. Rajan, Briarcliff Manor, NY (US);

Yuan Yuan, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for detecting a source-related risk and generating an alert concerning the source-related risk are disclosed. Criteria of the source-related risk are defined. Thresholds associated with the source-related risk are defined. Every operation on an object is detected. If an operation on an object satisfies a criterion among the criteria or if the operation causes to exceed a threshold among the thresholds, an alert is generated for the operation.


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