The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

May. 02, 2008
Applicants:

Robert J. Buchler, Calabasas, CA (US);

Gang Kevin Liu, Simi Valley, CA (US);

Inventors:

Robert J. Buchler, Calabasas, CA (US);

Gang Kevin Liu, Simi Valley, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01); G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for estimating a probability of failure of a least-squares ambiguity decorrelation adjustment (LAMBDA) method is provided. The LAMBDA method is used for estimation of double difference carrier phase integer ambiguity. A plurality of condition sets are selected. Each condition set comprises a probability of failure (P) for a boot-strap method of estimation of the double difference carrier phase integer ambiguity, a number of space vehicles (N), and a ratio test tolerance for the LAMBDA method. A plurality of Monte Carlo simulations are run on the plurality of condition sets to obtain a plurality of result sets. Each result set comprises a probability of lambda fail (P) and a probability of lambda reject (P) for one condition set of the plurality of condition sets. A lookup table is created with the plurality of result sets. A value of Pfor given values of P, P, and Nis estimated through employment of the lookup table.


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