The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Jun. 05, 2009
Patrick D. Mcnamara, San Francisco, CA (US);
Douglas C. Lee, Cupertino, CA (US);
Alan R. Gilchrist, Danville, CA (US);
Sung-wook Kang, Santa Clara, CA (US);
Craig A. Pietrow, Saratoga, CA (US);
Patrick D. McNamara, San Francisco, CA (US);
Douglas C. Lee, Cupertino, CA (US);
Alan R. Gilchrist, Danville, CA (US);
Sung-Wook Kang, Santa Clara, CA (US);
Craig A. Pietrow, Saratoga, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
In an embodiment, a test method is implemented to test an integrated circuit that includes at least one processor. The method may include programming a memory to which the integrated circuit is coupled during testing with one or more test programs. The integrated circuit may be booted, and the processor may execute the test programs from the memory. In one embodiment, the memory may also store a control program that may manage the execution of the tests. In an embodiment, the control program may also implement a protocol to communicate with the ATE to perform the testing. The protocol may be implemented over a set of general purpose input/output (I/O) pins, for example. Using the protocol and test vectors on the ATE, the tests may be selected and executed, and test results may be reported.