The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Apr. 23, 2008
Revathi Sundara Raghavan, San Diego, CA (US);
Puay Hoe See, San Diego, CA (US);
Rema Vaidyanathan, San Diego, CA (US);
Richard M. Schierbeck, Ii, San Diego, CA (US);
Sudarsan Krishnan, San Diego, CA (US);
Zae Yong Choi, San Jose, CA (US);
Revathi Sundara Raghavan, San Diego, CA (US);
Puay Hoe See, San Diego, CA (US);
Rema Vaidyanathan, San Diego, CA (US);
Richard M. Schierbeck, II, San Diego, CA (US);
Sudarsan Krishnan, San Diego, CA (US);
Zae Yong Choi, San Jose, CA (US);
QUALCOMM, Incorporated, San Diego, CA (US);
Abstract
A method for measuring non-linear characteristics of a power amplifier is described. A calibration waveform is calculated during a testing procedure period. Amplitude characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Phase characteristics of the calibration waveform at the output of the power amplifier are measured during the testing procedure period. Pre-distortion techniques are configured based on the amplitude characteristics and the phase characteristics to be used during a normal operation period of a transmitter.