The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Feb. 06, 2009
Applicants:

Venkata Krishna Kishore, Bloomington, IL (US);

Zhigang Guo, Champaign, IL (US);

Min LI, Champaign, IL (US);

Daolong Wang, Normal, IL (US);

Libardo Andres Gutierrez Rojas, Northfield, MN (US);

Joseph Dallas Clarke, V, Durham, NC (US);

Joseph Byrum, West Des Monies, IA (US);

Inventors:

Venkata Krishna Kishore, Bloomington, IL (US);

Zhigang Guo, Champaign, IL (US);

Min Li, Champaign, IL (US);

Daolong Wang, Normal, IL (US);

Libardo Andres Gutierrez Rojas, Northfield, MN (US);

Joseph Dallas Clarke, V, Durham, NC (US);

Joseph Byrum, West Des Monies, IA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 33/48 (2006.01); G06G 7/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided herein are methods for evaluating associations between candidate genes and a trait of interest in a population. The methods include a combination of genome-wide association analysis and one or more of nested association mapping (NAM), expression QTL analysis (eQTL), and allele epistastic analysis (AEA). Markers are selected or prioritized if they are shown to be positively-correlated with a trait of interest using GWA and a combination of one or both of NAM and eQTL. Also provided are models for evaluating the association between a candidate marker and a trait in a nested population of organisms. These methods include single marker regression and multiple marker regression models. Markers identified using the methods of the invention can be used in marker assisted breeding and selection, as genetic markers for constructing linkage maps, for gene discovery, for identifying genes contributing to a trait of interest, and for generating transgenic organisms having a desired trait.


Find Patent Forward Citations

Loading…