The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Oct. 29, 2007
Applicants:

Robert Jay Greenberg, Los Angeles, CA (US);

Kelly Hobart Mcclure, Simi Valley, CA (US);

James Singleton Little, Saugus, CA (US);

Rongqing Dai, Valencia, CA (US);

Arup Roy, Santa Clarita, CA (US);

Richard Agustin Castro, Pasadena, CA (US);

John Reinhold, Tarzana, CA (US);

Kea-tiong Tang, Temple City, CA (US);

Sumit Yadav, Los Angeles, CA (US);

Chunhong Zhou, Pasadena, CA (US);

Dao Min Zhou, Saugus, CA (US);

Pishoy Maksy, Sherman Oaks, CA (US);

Inventors:

Robert Jay Greenberg, Los Angeles, CA (US);

Kelly Hobart McClure, Simi Valley, CA (US);

James Singleton Little, Saugus, CA (US);

Rongqing Dai, Valencia, CA (US);

Arup Roy, Santa Clarita, CA (US);

Richard Agustin Castro, Pasadena, CA (US);

John Reinhold, Tarzana, CA (US);

Kea-Tiong Tang, Temple City, CA (US);

Sumit Yadav, Los Angeles, CA (US);

Chunhong Zhou, Pasadena, CA (US);

Dao Min Zhou, Saugus, CA (US);

Pishoy Maksy, Sherman Oaks, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61N 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present application deals generally with the stimulation of neural tissue by electronic means and specifically with controlling the level of electrical stimulation in order to prevent damage to the neural tissue. Methods presented in the disclosure include detecting current leakage via electrode impedance measurement, electrode capacitance measurement, and testing the electrode response to test current pulse. Apparatus presented in the disclosure include circuitry and systems capable of performing the methods disclosed.


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