The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Apr. 18, 2008
Applicants:

Hirotaka Shiiyama, Yokohama, JP;

Masahiro Matsushita, Yokohama, JP;

Hidetomo Sohma, Yokohama, JP;

Tomomi Takata, Yokohama, JP;

Koichi Magai, Tokyo, JP;

Inventors:

Hirotaka Shiiyama, Yokohama, JP;

Masahiro Matsushita, Yokohama, JP;

Hidetomo Sohma, Yokohama, JP;

Tomomi Takata, Yokohama, JP;

Koichi Magai, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/60 (2006.01); G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plurality of feature points are extracted from an inputted image, and a feature amount is computed with regard to the feature point thus extracted. A prescribed plurality of alterations, i.e., a rotation, an enlargement, or a reduction, are applied to the inputted image, a plurality of altered feature amounts are estimated with regard to the feature point, and an image is retrieved from among stored images that are stored upon a storage apparatus and that is most similar to the inputted image, in accordance with the plurality of the estimated altered feature amounts.


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