The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Oct. 19, 2007
Quantitative tract-of-interest metrics for white matter integrity based on diffusion tensor mri data
David H Laidlaw, Barrington, RI (US);
Song Zhang, Starkville, MS (US);
Stephanie Yat-lin Lee, Needham, MA (US);
Stephen Correia, Cranston, RI (US);
David H Laidlaw, Barrington, RI (US);
Song Zhang, Starkville, MS (US);
Stephanie Yat-Lin Lee, Needham, MA (US);
Stephen Correia, Cranston, RI (US);
Brown University, Providence, RI (US);
Abstract
The exemplary embodiments of this invention relate at least in part to a method, apparatus and system to characterize white matter, such as for detecting a presence of a white matter impairment. An exemplary method to characterize white matter includes identifying at least one tract of interest (TOI) in the brain of a subject of interest, the tract of interest having a set of streamtubes representing white matter fibers; determining a set of quantitative tractography metrics associated with the tract of interest, the set of quantitative tractography metrics having a plurality of members; and comparing at least one member of the determined set of quantitative tractography metrics to a corresponding member of a reference set of quantitative tractography metrics, or comparison of one TOI in a single subject or group of subjects and other TOI in the same subject(s).