The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Jun. 23, 2008
Albert Ezekiel, Los Angeles, CA (US);
Brent Mccleary, Chino Hills, CA (US);
Albert Ezekiel, Los Angeles, CA (US);
Brent McCleary, Chino Hills, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
An automatic target recognition system with adaptive metric selection. The novel system includes an adaptive metric selector for selecting a match metric based on the presence or absence of a particular feature in an image and a matcher for identifying a target in the image using the selected match metric. In an illustrative embodiment, the adaptive metric selector is designed to detect a shadow in the image and select a first metric if a shadow is detected and not cut off, and select a second metric otherwise. The system may also include an automatic target cuer for detecting targets in a full-scene image and outputting one or more target chips, each chip containing one target. The adaptive metric selector adaptively selects the match metric for each chip separately, and may also adaptively select an appropriate chip size such that a shadow in the chip is not unnecessarily cut off.