The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8169695 B1

PDF
Full Text
Expired
Date of Patent:
May. 01, 2012

Filed:

Nov. 10, 2008
Applicant:

Zeev Zalevsky, Rosh HaAyin, IL;

Inventor:

Zeev Zalevsky, Rosh HaAyin, IL;

Assignee:

Xceed Imaging Ltd., Rosh Haayin, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An imaging method and system are presented for use in sub-wavelength super resolution imaging of a subject. The imaging system comprises a spatial coding unit configured for collecting light coming from the scanned subject and being spaced from the subject a distance smaller than a wavelength range of said light; a light detection unit located upstream of the spatial coding unit with respect to light propagation from the object, and configured to define a pixel array and a spatial decoding unit, which is associated with said pixel array and is configured for applying spatial decoding to a magnified image of the scanned subject, thereby producing nanometric spatial resolution of the image.


Find Patent Forward Citations

Zalevsky, Zeev. (2012). Optical sub-wavelength super resolution imaging system producing nanometric spatial resolution of a scanned subject (U.S. Patent No. 8169695). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8169695

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