The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Sep. 14, 2007
Christopher Knutson, Chicago, IL (US);
Crystal Duke, Stanford, CA (US);
Gary Stacey, Marshfield, MA (US);
Dan Mueth, Chicago, IL (US);
Evan Tanner, La Jolla, CA (US);
Osman Akcakir, Chicago, IL (US);
Haojun Fu, Naperville, IL (US);
Robert Lancelot, Barrington, IL (US);
Tania Chakrabarty, Chicago, IL (US);
Kenneth Bradley, Hinsdale, IL (US);
Christopher Knutson, Chicago, IL (US);
Crystal Duke, Stanford, CA (US);
Gary Stacey, Marshfield, MA (US);
Dan Mueth, Chicago, IL (US);
Evan Tanner, La Jolla, CA (US);
Osman Akcakir, Chicago, IL (US);
Haojun Fu, Naperville, IL (US);
Robert Lancelot, Barrington, IL (US);
Tania Chakrabarty, Chicago, IL (US);
Kenneth Bradley, Hinsdale, IL (US);
Arryx, Inc., Chicago, IL (US);
Abstract
Methods and apparatus for analyzing surface properties of particles are provided. A method for analyzing the surface properties of the particle includes a associating a first particle with a first capture zone having a specific binding affinity for a first chemical species, applying an optical force to the first particle, sensing a response of the first particle to the optical force, and using the sensed response to determine the presence, absence or quantity of the first chemical species on the first particle surface. This process may be repeated in parallel to test multiple particles. In addition to directly testing the surface properties of the particles, the method can be used in direct, indirect and competitive assays to determine the presence, absence or quantity of free or immobilized analytes. A fluidic cartridge with capture zones having avidities that are tuned for the use of optical forces is provided. A software routine for performing the method is also provided.