The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

May. 20, 2008
Applicant:

Sywe Neng Lee, Taipei, TW;

Inventor:

Sywe Neng Lee, Taipei, TW;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); H04N 9/083 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image sampling method for an image sensor is provided herein. The image sensor includes a plurality of pixel elements in the intersections of a plurality of rows and a plurality of columns. During either one of the odd field period or the even field period, the pixel elements in the intersections of the odd rows and the odd columns and the pixel elements in the intersection of the even rows and the even columns are sampled. During the other field period, the pixel elements in the intersections of the even rows and the odd columns and the pixel elements in the intersection of the odd rows and the even columns are sampled. The image processing method utilizes the pixel data in a specific block sampled from the pixel elements during one of the odd and the even field periods to interpolate a specific pixel in the specific block.


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