The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Apr. 02, 2009
Applicants:

Xiaohong Quan, San Diego, CA (US);

Tongyu Song, San Diego, CA (US);

Lennart Mathe, San Diego, CA (US);

Dinesh J. Alladi, San Diego, CA (US);

Inventors:

Xiaohong Quan, San Diego, CA (US);

Tongyu Song, San Diego, CA (US);

Lennart Mathe, San Diego, CA (US);

Dinesh J. Alladi, San Diego, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03L 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for generating precise non-overlap time and clock phase delay time across a desired frequency range are provided. In one configuration, a device includes a non-overlapping clock generation circuit which comprises a delay lock loop (DLL) circuit that in turn generates a control voltage to a clock generator circuit coupled thereto. The control voltage operates to maintain precise timing relationship of non-overlapping delayed clock signals generated by the clock generator circuit. In one aspect, the DLL circuit receives an input clock with a known duty cycle and derives an output control voltage to fix the unit delay to a certain portion of the input clock cycle. In a further aspect, the clock generator circuit includes a plurality of voltage-controlled delay cells coupled to the DLL circuit to generate a first set of clock signals and a second set of clock signals delayed from the first set of clock signals by a non-overlapping time (t) that is independent of manufacturing process variations.


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