The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2012
Filed:
Mar. 07, 2006
Takashi Sumiyoshi, Kyoto, JP;
Takashi Sumiyoshi, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
In a chromatograph mass spectrometer capable of defining an appropriate measurement time range and selectively performing a scan measurement, selected ion monitoring (SIM) measurement or simultaneous scan/SIM measurement in that time range, a total ion chromatogramobtained by a scan measurement of a standard sample and a previously-created compound tableare displayed on the screen of a display unit in the process of setting parameters in a measurement condition table. An operator selects a compound that should undergo the simultaneous scan/SIM measurement, then places a checkmark in an appropriate check box in the compound table, and finally clicks the 'Auto-Create' button. Then, a measurement time range for the selected compound is defined by adding a time span before and after the retention time of that compound, respectively, and a measurement condition tableis automatically created and displayed on the screen. This table includes instructions for performing a simultaneous scan/SIM measurement at specific mass-to-charge ratios characteristic of the selected compound during the aforementioned measurement time range.